Bug #4058
closed
nfdc input and output format changes cause integration tests to fail
Added by Eric Newberry over 7 years ago.
Updated over 7 years ago.
Category:
Integration Tests
Description
Changes to the arguments and output format of the nfdc command cause the following integration test scenarios to fail:
- test_route_expiration
- test_nexthopfaceid
- test_route_inheritance
All calls to nfdc and nfd-status using deprecated syntax should also be corrected.
Files
- Status changed from New to In Progress
Given nfdc refactoring is (almost) complete, all usages of deprecated syntax should be replaced.
Junxiao Shi wrote:
Given nfdc refactoring is (almost) complete, all usages of deprecated syntax should be replaced.
Agreed. I'll update the issue description to include this.
It looks like I can't change the issue description. @Junxiao could you update it to include the content of notes 2 and 3?
- Description updated (diff)
- Status changed from In Progress to Code review
- % Done changed from 0 to 90
A commit has been pushed to Gerrit for updating all syntax of nfdc and changing calls to nfd-status to their nfdc equivalent, with the exception of test_nfdc.
For test_nfdc, I propose restructuring the test cases from the following:
nfdc create / add-nexthop / destroynfdc add-nexthop / remove-nexthopnfdc register / unregister
to the following:
nfdc face create / route add / route remove / face destroy (and verify the RIB with nfdc rib) - since direct adds to the FIB are no longer possible through nfdc, merge all three of the existing test casesnfdc strategy set / strategy show / strategy unset - new test case
I was able to merge the two proposed test cases. Code will be posted for review shortly.
- % Done changed from 90 to 100
Changes to test_nfdc have been pushed to Gerrit for review.
- Related to Bug #3933: Nack test incorrect counting of Nacks added
- Status changed from Code review to Closed
There are still some uses of the deprecated nfdc input and output format in test_nack, but they will be addressed in the commit for #3933.
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